Lsi/Vlsi Testability Design

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Lsi/Vlsi Testability Design

Lsi/Vlsi Testability Design

Frank F. Tsui

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Kateqoriyalar:

Computers - Programming

İl:

1987

Nəşriyyat:

Mcgraw-Hill (Tx)

Dil:

english

Səhifələr:

715

ISBN 10:

0070653410

ISBN 13:

9780070653412

Fayl:

DJVU, 6.75 MB

IPFS:

,

english, 1987

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Bəlkə Sizə maraqlıdır

Charles E. Stroud (auth.) — A Designer’s Guide to Built-In Self-Test

G. Russell, I. Sayers — Advanced Simulation and Test Methodols for VLSI Design

M. Bushnell, V. Agrawal — Essentials of Electronic Testing - For Digital, Memory and Mixed-Signal VLSI Circuits

Unknown — "Automatic Testing". In: Wiley Encyclopedia of Electrical and Electronics Engineering

Richard J. Peterson — Power-Constrained Testing Of Vlsi Circuits

Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen — VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

Norman G. Einspruch — Vlsi Design

A F Schwarz — Handbook of VLSI chip design and expert systems

Francis C. Wang — Digital Circuit Testing: A Guide to DFT and Other Techniques

Mark Zwolinski — Digital System Design with Systemverilog (Paperback) (Prentice Hall PTR Signal Integrity Library)

Zwoliński, Mark — Digital system design with SystemVerilog

Colin Maunder — The Board Designer's Guide to Testable Logic Circuits (Electronic Systems Engineering Series)

Hideo Fujiwara — Logic testing and design for testability

Nicola Nicolici, Bashir M. Al-Hashimi (auth.) — Power-constrained Testing of VLSI Circuits

Ricardo Reis, Marcelo Lubaszewski, Jochen A.G. Jess — Design of Systems on a Chip: Design and Test

John G. Webster (Editor) — 13.Computer-Aided Design of Integrated Circuits

Alexander Miczo — Digital Logic Testing and Simulation

N. K. Jha, S. Gupta — Testing of Digital Systems

Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman — Digital Systems Testing & Testable Design

M. Bushnell; Vishwani Agrawal — Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

M. Bushnell, Vishwani Agrawal — Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Kwang-Ting (Tim) Cheng, Vishwani D. Agrawal — Unified Methods for VLSI Simulation and Test Generation

Santanu Chattopadhyay — Thermal-Aware Testing of Digital VLSI Circuits and Systems

Hurst, Stanley Leonard — VLSI testing : digital and mixed analogue/digital techniques

Taylor, Gaynor E.; Russell, Gordon — Algorithmic and knowledge based CAD for VLSI

George W. Zobrist — VLSI Fault Modeling and Testing Techniques:

Vasant B. Rao, David V. Overhauser, Timothy N. Trick, Ibrahim N. Hajj — Switch-Level Timing Simulation of MOS VLSI Circuits

Charles E. Stroud — A Designer s Guide to Built-in Self-Test

Zainalabedin Navabi (auth.) — Digital System Test and Testable Design: Using HDL Models and Architectures

Raimund Ubar, Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus — Design and Test Technology for Dependable Systems-on-Chip

Ubar, Raimund; Raik, Jaan; Vierhaus, Heinrich Theodor — Design and Test Technology for Dependable Systems-on-Chip

F. Lombardi, M.G. Sami — Testing and Diagnosis of VLSI and ULSI

Smita Krishnaswamy, Igor L. Markov, John P. Hayes (auth.) — Design, Analysis and Test of Logic Circuits Under Uncertainty

Gert Jervan. — Hybrid built-in self-test and test generation techniques for digital systems

T. W. Williams (auth.), Fabrizio Lombardi, Mariagiovanna Sami (eds.) — Testing and Diagnosis of VLSI and ULSI

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